6 Patents
- US124943842025Chip Defect Modifying Device and Method
China Electronic Product Reliability And Environmental Testing Research Institute
0 cites - US123393102025Method for Monitoring Degradation Mechanism of Switch Device in Power Conversion Circuit
China Electronic Product Reliability And Environmental Testing Research Institute
0 cites - US123405932025Vehicle Drivable Area Detection Method, System, and Autonomous Vehicle Using the System
Shenzhen Yinwang Intelligent Technologies Co., Ltd.
0 cites - US123010972025Fault Prediction Method and Apparatus for Power Conversion Device, and Power Conversion System
China Electronic Product Reliability And Environmental Testing Research Institute ((The Fifth Electronic Research Institute Of Ministry Of Industry And Information Technology) (CEPREI Laboratory))
0 cites - US122419482025Asymmetric Compensation Method and Apparatus for Two-port Near Field Probe, Computer Device, and Storage Medium
SOUTH CHINA UNIVERSITY OF TECHNOLOGY
0 cites - US120664682024Method and Device for Detecting System Failure, Computer Device, and Storage Medium
CHINA ELECTRONIC PRODUCT RELIABILITY AND ENVIRONMENTAL TESTING RESEARCH INSTITUTE ((THE FIFTH ELECTRONIC RESEARCH INSTITUTE OF MINISTRY OF INDUSTRY ANBD INFORMATION TECHNOLOGY (CEPREI))
0 cites