Ying-yen Chen

5 Patents

• US125105952025

  Scan Clock Gating Controller and Method for Performing Stuck-at Fault Test Among Multiple Block Circuits

  Realtek Semiconductor Corp.

  0 cites
• US123208492025

  Clock Control Circuit and Method

  Realtek Semiconductor Corporation

  0 cites
• US122115702025

  Test Circuit and Method for Reading Data from a Memory Device During Memory Dump

  Realtek Semiconductor Corp.

  0 cites
• US120447212024

  Scan Chain Designing and Circuit Testing Method

  REALTEK SEMICONDUCTOR CORPORATION

  0 cites
• US120320202024

  Calibration Data Generation Circuit and Associated Method

  REALTEK SEMICONDUCTOR CORPORATION

  0 cites