Yi-neng Chang

4 Patents

• US125910062026

  Semiconductor Device Tester

  Taiwan Semiconductor Manufacturing Company Limited

  0 cites
• US124446332025

  Workpiece Handling System, Method of Calibrating Workpiece Handling System and Method of Manufacturing Semiconductor Package

  Taiwan Semiconductor Manufacturing Company, Ltd.

  0 cites
• US123264632025

  Probe Card Needle Shape and Method of Manufacturing

  Taiwan Semiconductor Manufacturing Co., Ltd.

  0 cites
• US122419292025

  Work Press Assembly for Test Handler

  TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY, Ltd.

  0 cites