11 Patents
- US125734382026Device Having Rows of MRAM Cells Configured for Concurrent Writing and Reading
TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY, Ltd.
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- US123620282025Memory Test Circuit, Memory Chip, and Testing Method of Memory Chip
Taiwan Semiconductor Manufacturing Company, Ltd.
0 cites - US122833402025Method for Controlling Sense Amplifier and Control Device Using the Same
Taiwan Semiconductor Manufacturing Company, Ltd.
0 cites - US122370092025Sense Amplifier Circuit, Memory Circuit, and Sensing Method Thereof
Taiwan Semiconductor Manufacturing Company, Ltd.
0 cites - US121701232024Memory Test Circuit, Memory Array, and Testing Method of Memory Array
Taiwan Semiconductor Manufacturing Company, Ltd.
0 cites - US121657332024Sense Amplifier, Memory Device and Operation Method Thereof
Taiwan Semiconductor Manufacturing Company, Ltd.
0 cites - US120514572024High-density Memory Cells and Layouts Thereof
TAIWAN SEMICONDUCTOR MANUFACTURING CO., Ltd.
0 cites - US120400112024Memory Device with Low Power Consumption and Operation Method Thereof
Taiwan Semiconductor Manufacturing Company, Ltd.
0 cites - 0 cites