Yi-kai Chao

4 Patents

• US122286082025

  Probe Station Capable of Maintaining Stable and Accurate Contact to Device Under Test

  NANYA TECHNOLOGY CORPORATION

  0 cites
• US119404862024

  Probe Station Capable of Maintaining Stable and Accurate Contact to Device Under Test

  NANYA TECHNOLOGY CORPORATION

  0 cites
• US117744912023

  System and Method for Testing a Semiconductor Chip

  NANYA TECHNOLOGY CORPORATION

  0 cites
• US117332912023

  Chip Socket for Testing Semiconductor Chip

  NANYA TECHNOLOGY CORPORATION

  0 cites