4 Patents
- US126017602026Probe Card Device and Tunnel-type Probe Thereof
CHUNGHWA PRECISION TEST TECH. CO., Ltd.
0 cites - US126017612026Vertical Probe Card and Open-type Probe Thereof
CHUNGHWA PRECISION TEST TECH. CO., Ltd.
0 cites - US125882292026Gate-top Dielectric Structure for Self-aligned Contact
TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY, Ltd.
0 cites - 0 cites