4 Patents
- US124445682025Sample Holder of Transmission Electron Microscope and Semiconductor Device Inspection Method Using the Sample Holder
SAMSUNG ELECTRONICS CO., Ltd.
0 cites - US124178952025Sample Holder for Transmission Electron Microscope, Sample Analysis System Including the Same, and Method for Analyzing Sample Using the Same
SAMSUNG ELECTRONICS CO., Ltd.
0 cites - 0 cites
- US119489642024Image Sensor Having Vertical, Transfer, Reset, Source Follower, and Select Transistors Vertically Aligned Over the Photodiode
Samsung Electronics Co., Ltd.
0 cites