Patents/Inventors

Yeishin Tung

San Jose, CAUS4 patents

5 Patents

US122258082025
In-line Monitoring of OLED Layer Thickness and Dopant Concentration
Applied Materials, Inc.
0 cites
US121637832024
Digital Holography for Alignment in Layer Deposition
Applied Materials, Inc.
0 cites
US121376012024
In-line Monitoring of OLED Layer Thickness and Dopant Concentration
Applied Materials, Inc.
0 cites
US118897402024
In-line Monitoring of OLED Layer Thickness and Dopant Concentration
Applied Materials, Inc.
0 cites
US118568332023
In-line Monitoring of OLED Layer Thickness and Dopant Concentration
Applied Materials, Inc.
0 cites