Patents/Inventors

Yasuyuki Ikeda

KyotoJP6 patents

6 Patents

US124307422025
Inspection System and Inspection Method
OMRON CORPORATION
0 cites
US124307482025
Image Inspection Device, Image Inspection Method, and Prelearned Model Generation Device
OMRON Corporation
0 cites
US123301452025
Supported Catalyst Synthesis Device and Fine Particle Synthesis Device
FURUYA METAL CO., Ltd.
0 cites
US118301742023
Defect Inspecting Device, Defect Inspecting Method, and Storage Medium
OMRON Corporation
0 cites
US117692482023
Image Processing Device, Image Processing Method, and Image Processing Non-transitory Computer Readable Medium for Verifying Detectable Range of Defect Image
OMRON Corporation
0 cites
US115743972023
Image Processing Device, Image Processing Method, and Computer Readable Recording Medium
OMRON Corporation
0 cites