Patents/Inventors

Yasushi Ebizuka

TokyoJP2 patents

3 Patents

US122111942025
Defect Inspection with Images of Different Synthesis Ratios
Hitachi High-tech Corporation
0 cites
US117911242023
Charged Particle Beam Apparatus
Hitachi High-technologies Corporation
0 cites
US117840232023
Charged Particle Beam Apparatus
Hitachi High-technologies Corporation
0 cites