Patents/Inventors

Yasuhiro Shirasaki

TokyoJP7 patents

8 Patents

US126092692026
Inspection System
Hitachi High-tech Corporation
0 cites
US126092742026
Charged Particle Beam Device
Hitachi High-tech Corporation
0 cites
US125735862026
Charged Particle Beam Apparatus
HITACHI HIGH-TECH CORPORATION
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US124068262025
Charged Particle Beam Device and Sample Observation Method
HITACHI HIGH-TECH CORPORATION
0 cites
US121968022025
Semiconductor Inspection Device and Method for Inspecting Semiconductor Sample
HITACHI HIGH-TECH CORPORATION
0 cites
US121256672024
Charged Particle Beam Device
HITACHI HIGH-TECH CORPORATION
0 cites
US119159032024
Electron Beam Application Apparatus
HITACHI HIGH-TECH CORPORATION
0 cites
US116315682023
Device Defect Detection Method Using a Charged Particle Beam
HITACHI HIGH-TECH CORPORATION
0 cites