Yaoping Wang

8 Patents

• US126029102026

  Method for Detecting Defect and Method for Training Model

  BOE TECHNOLOGY GROUP CO., Ltd.

  0 cites
• US124004862025

  Method and Device for Processing Product Manufacturing Messages, Electronic Device, and Computer-readable Storage Medium

  BOE TECHNOLOGY GROUP CO., Ltd.

  0 cites
• US123753482025

  Method and Apparatus for Device Configuration Parameter Processing, Method and Apparatus for Data Analysis, Computing Device, Computer-readable Storage Medium and Computer Program Product

  BOE TECHNOLOGY GROUP CO., Ltd.

  0 cites
• US123470852025

  Method and Device for Detecting Defect, Storage Medium and Electronic Device

  BOE TECHNOLOGY GROUP CO., Ltd.

  0 cites
• US121064652024

  Image Annotation Method, Device and System

  BOE Technology Group Co., Ltd.

  0 cites
• US120205162024

  Method and Device for Processing Product Manufacturing Messages, Electronic Device, and Computer-readable Storage Medium

  BOE TECHNOLOGY GROUP CO., Ltd.

  0 cites
• US119829992024

  Defect Detection Task Processing Method, Device, Apparatus and Storage Medium

  BOE TECHNOLOGY GROUP CO., Ltd.

  0 cites
• US118809682024

  Distributed Computing System for Product Defect Analysis

  BOE TECHNOLOGY GROUP CO., Ltd.

  0 cites