Patents/Inventors

Yaoling Pan

San Jose, CAUS13 patents

13 Patents

US125371792026
Capacitive Sensing Data Integration for Plasma Chamber Condition Monitoring
Applied Materials, Inc.
0 cites
US124379792025
Capacitive Sensors and Capacitive Sensing Locations for Plasma Chamber Condition Monitoring
Applied Materials, Inc.
0 cites
US122285342025
Capacitive Sensor for Monitoring Gas Concentration
Applied Materials, Inc.
0 cites
US121639112024
Capacitive Sensor Housing for Chamber Condition Monitoring
Applied Materials, Inc.
0 cites
US121230902024
Differential Capacitive Sensor for In-situ Film Thickness and Dielectric Constant Measurement
APPLIED MATERIALS, Inc.
0 cites
US120062092024
MEMS and NEMS Structures
Obsidian Sensors, Inc.
0 cites
US120092362024
Sensors and System for In-situ Edge Ring Erosion Monitor
Applied Materials, Inc.
0 cites
US119598682024
Capacitive Sensor for Monitoring Gas Concentration
Applied Materials, Inc.
0 cites
US117812142023
Differential Capacitive Sensors for In-situ Film Thickness and Dielectric Constant Measurement
APPLIED MATERIALS, Inc.
0 cites
US116856492023
Capping Plate for Panel Scale Packaging of MEMS Products
Obsidian Sensors, Inc.
0 cites
US115812062023
Capacitive Sensor for Chamber Condition Monitoring
Applied Materials, Inc.
0 cites
US115519052023
Resonant Process Monitor
Intel Corporation
0 cites
US115453462023
Capacitive Sensing Data Integration for Plasma Chamber Condition Monitoring
Applied Materials, Inc.
0 cites