12 Patents
- US125118742025Smart Navigation Method and System Based on Topological Map
BEIJING JINGDONG 360 DEGREE E-COMMERCE CO., Ltd.
0 cites - US123941412025Model Generation Method and Apparatus, Image Perspective Determining Method and Apparatus, Device, and Medium
Beijing Jingdong Qianshi Technology Co., Ltd.
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- US119714512024Method for Determining Parameters in On-wafer Calibration Piece Model
The 13Th Research Institute Of China Electronics Technology Group Corporation
0 cites - US119274362024Measurement Machine and Method for Detecting a Defect in Solder Joints
Hewlett Packard Enterprise Development LP
0 cites - US117311932023Preparation Method of Improved Sintered Neodymium-iron-boron (nd—fe—b) Casting Strip
BAOTOU JINSHAN MAGNETIC MATERIAL CO., Ltd.
0 cites - US117332982023Two-port On-wafer Calibration Piece Circuit Model and Method for Determining Parameters
The 13Th Research Institute Of China Electronics Technology Group Corporation
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- US117052562023Neodymium-iron-boron Permanent Magnet and Preparation Method and Use Thereof
BAOTOU JINSHAN MAGNETIC MATERIAL CO., Ltd.
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