Patents/Inventors

Yanir Hainick

Tel-AvivIL6 patents

7 Patents

US124678792025
Optical Phase Measurement Method and System
NOVA Ltd.
0 cites
US124561772025
System and Method for Digital Optical Aberration Correction and Spectral Imaging
PXE COMPUTATIONAL IMAGING Ltd.
0 cites
US124222512025
System and Method for Optical Imaging and Measurement of Objects
PXE Computational Imaging Ltd.
0 cites
US123665332025
Hybrid Metrology Method and System
0 cites
US120663852024
Raman Spectroscopy Based Measurements in Patterned Structures
NOVA Ltd
0 cites
US120255602024
Hybrid Metrology Method and System
0 cites
US119468752024
Optical Phase Measurement System and Method
NOVA Ltd.
0 cites