Patents/Inventors

Yang-hung Cheng

ZhubeiTW1 patent

2 Patents

US123928032025
Probe Card, Method for Designing Probe Card, Method for Producing Tested Semiconductor Device Method for Testing Unpackaged Semiconductor by Probe Card, Device Under Test and Probe System
MPI CORPORATION
0 cites
US117744682023
Vertical Probe Head
MPI CORPORATION
0 cites