Patents/Inventors

Yamato Niitani

YokohamaJP1 patent

2 Patents

US124554382025
Microscope Apparatus, Sample Refractive Index Measurement Method for Microscope Apparatus, and Sample Refractive Index Measurement Program for Microscope Apparatus
NIKON CORPORATION
0 cites
US124363742025
Microscope, Observation Method, and Program
NIKON CORPORATION
0 cites