Ya-li Chen

4 Patents

• US124871882025

  Wafer Defect Analyzing Device and Wafer Defect Analyzing Method

  INGENTEC CORPORATION

  0 cites
• US119815942024

  Quartz Glass with Low Content of Hydroxyl and High Purity and Method for Preparing the Same

  JIANGSU ZHONGTIAN TECHNOLOGY CO., Ltd.

  0 cites
• US117914392023

  Magnetic Light-emitting Structure

  Ingentec Corporation

  0 cites
• US116213682023

  Magnetic Light-emitting Structure and Fabrication Method for Manufacturing a Magnetic Light-emitting Element

  Ingentec Corporation

  0 cites