7 Patents
- US124068772025Homogeneous Source/drain Contact Structure
TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY, Ltd.
0 cites - US123879772025Self-aligned Scheme for Semiconductor Device and Method of Forming the Same
TAIWAN SEMICONDUCTOR MANUFACTURING CO., Ltd.
0 cites - US123681032025Diffusion Barrier Layer for Conductive via to Decrease Contact Resistance
Taiwan Semiconductor Manufacturing Company, Ltd.
0 cites - US123622352025Barrier Free Interface Between BEOL Interconnects
Taiwan Semiconductor Manufacturing Company, Ltd.
0 cites - US118307702023Self-aligned Scheme for Semiconductor Device and Method of Forming the Same
TAIWAN SEMICONDUCTOR MANUFACTURING CO., Ltd
0 cites - US117422912023Diffusion Barrier Layer for Conductive via to Decrease Contact Resistance
Taiwan Semiconductor Manufacturing Company, Ltd.
0 cites - US116949262023Barrier Free Interface Between Beol Interconnects
Taiwan Semiconductor Manufacturing Company, Ltd.
0 cites