5 Patents
- US125138972025Semiconductor Structure Having Void in a Bit Line Contact Structure
CHANGXIN MEMORY TECHNOLOGIES, Inc.
0 cites - US123361632025Method of Forming Bit Line Contact Structure Using Series of Pickling Processes to Remove Native Oxide on Surface of the Active Areas
CHANGXIN MEMORY TECHNOLOGIES, Inc.
0 cites - US121502962024Method for Manufacturing Semiconductor Bit Line Contact Region with Different Doped Impurity Concentrations
CHANGXIN MEMORY TECHNOLOGIES, Inc.
0 cites - 0 cites
- US118680532024Method for Accurately Obtaining Photolithography Parameter
CHANGXIN MEMORY TECHNOLOGIES, Inc.
0 cites