Patents/Inventors

Xuguang Jiang

San Jose, CAUS2 patents

3 Patents

US117488712023
Alignment of a Specimen for Inspection and Other Processes
KLA Corp.
0 cites
US116762602023
Variation-based Segmentation for Wafer Defect Detection
KLA CORPORATION
0 cites
US116102962023
Projection and Distance Segmentation Algorithm for Wafer Defect Detection
KLA CORPORATION
0 cites