5 Patents
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- US116621972023Rapid Measurement Method for Ultra-thin Film Optical Constant
HUAZHONG UNIVERSITY OF SCIENCE AND TECHNOLOGY
0 cites - US116444132023Method for Measuring Dielectric Tensor of Material
HUAZHONG UNIVERSITY OF SCIENCE AND TECHNOLOGY
0 cites - US116198832023Snapshot Type Overlay Error Measuring Device and Measuring Method
HUAZHONG UNIVERSITY OF SCIENCE AND TECHNOLOGY
0 cites - 0 cites