16 Patents
- US125980912026Consensus Method and Apparatus, and Blockchain System
CHINA ACADEMY OF INFORMATION AND COMMUNICATIONS TECHNOLOGY
0 cites - US125936262026Method for Preparing Silicon-on-insulator
SHANGHAI INSTITUTE OF MICROSYSTEM AND INFORMATION TECHNOLOGY, CHINESE ACADEMY OF SCIENCES
0 cites - US124742772025Method for Determining Types of Defects in Monocrystalline Silicon Wafer
ZING SEMICONDUCTOR CORPORATION
0 cites - US124689872025System and Method for Efficient Transformation Prediction in a Data Analytics Prediction Model Pipeline
International Business Machines Corporation
0 cites - US123984852025Method of Detecting Crystallographic Defects and Method of Growing an Ingot
SHANGHAI INSTITUTE OF MICROSYSTEM AND INFORMATION TECHNOLOGY, CHINESE ACADEMY OF SCIENCES
0 cites - US124009172025Method for Verification of Conductivity Type of Silicon Wafer
SHANGHAI INSTITUTE OF MICROSYSTEM AND INFORMATION TECHNOLOGY, CHINESE ACADEMY OF SCIENCES
0 cites - 0 cites
- US123344032025Measuring Method of Resistivity of a Wafer
SHANGHAI INSTITUTE OF MICROSYSTEM AND INFORMATION TECHNOLOGY CHINESE ACADEMY OF SCIENCES
0 cites - 0 cites
- US121307922024Data Merging in Distributed Computing System
International Business Machines Corporation
0 cites - US120925882024Method for Characterizing Defects in Silicon Crystal
Shanghai Institute Of Microsystem And Information Technology, Chinese Academy Of Sciences
0 cites - US120856002024Non-invasive Online Monitoring Circuit for On-state Saturation Voltage of Power Semiconductor
Hunan Lanhai Electrical Engineering Co., Ltd.
0 cites - US119895602024Method and Device for Executing Instructions to Perform Artificial Intelligence
BEIJING HORIZON ROBOTICS TECHNOLOGY RESEARCH AND DEVELOPMENT CO., Ltd.
0 cites - US118109102023Group III Nitride Transistor Structure Capable of Reducing Leakage Current and Fabricating Method Thereof
SUZHOU INSTITUTE OF NANO-TECH AND NANO-BIONICS (SINANO) , CHINESE ACADEMY OF SCIENCES
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