4 Patents
- US125859892026Feature Effectiveness Assessment Method and Apparatus, Electronic Device, and Storage Medium
TENCENT TECHNOLOGY (SHENZHEN) COMPANY LIMITED
0 cites - US123101262025Infrared Photodetector Based on Van Der Waals Heterostructure and Preparation Method Thereof
SHANGHAI INSTITUTE OF TECHNICAL PHYSICS CHINESE ACADEMY OF SCIENCES
0 cites - US121764512024Momentum-matching and Band-alignment Van Der Waals (vdw) Infrared Photodetector and Fabrication Method Thereof
Shanghai Institute Of Technical Physics Of The Chinese Academy Of Sciences
0 cites - US118109882023Integrated Infrared Circular Polarization Detector with High Extinction Ratio and Design Method Thereof
Shanghai Institute Of Technical Physics, Chinese Academy Of Sciences
0 cites