2 Patents
- US120990252024Device and Method for Measuring Short-wavelength Characteristic X-ray Diffraction Based on Array Detection
THE 59TH INSTITUTE OF CHINA ORDNANCE INDUSTRY
0 cites - US118465952023Diffraction Device and Method for Non-destructive Testing of Internal Crystal Orientation Uniformity of Workpiece
THE 59TH INSTITUTE OF CHINA ORDNANCE INDUSTRY
0 cites