2 Patents
- US124930702025Parallel Accelerated Test Method and Apparatus That Separately Applies Multiple Sensitive Stresses to Multiple Components
China Electronic Product Reliability And Environmental Testing Research Institute ((The Fifth Electronic Research Institute Of Ministry Of Industry And Information Technology) (CEPREI))
0 cites - US121747152024Deep Learning Method Integrating Prior Knowledge for Fault Diagnosis
Hefei University Of Technology
0 cites