Patents/Inventors

Xiangang Luo

Fremont, CAUS77 patents

74 Patents

US126091612026
Programming Erase Blocks Coupled to a Same String
Micron Technology, Inc.
0 cites
US125853912026
Managing Allocation of Half Good Blocks
Micron Technology, Inc.
0 cites
US125473372026
Memory Sub-system for Monitoring Mixed Mode Blocks
Micron Technology, Inc.
0 cites
US125470812026
Illumination Compensation Method
THE INSTITUTE OF OPTICS AND ELECTRONICS, THE CHINESE ACADEMY OF SCIENCES
0 cites
US125302872026
Read Disturb Tracking Among Multiple Erase Blocks Coupled to a Same String
Micron Technology, Inc.
0 cites
US125052662025
High-order Rotational Symmetry Unit-based Nonlinear Geometric Phase Metasurface
THE INSTITUTE OF OPTICS AND ELECTRONICS, THE CHINESE ACADEMY OF SCIENCES
0 cites
US124232272025
Generating Virtual Blocks Using Partial Good Blocks
Micron Technology, Inc.
0 cites
US124067382025
Determining Offsets for Memory Read Operations
Micron Technology, Inc.
0 cites
US123933632025
Voltage Bin Calibration Based on a Voltage Distribution Reference Voltage
Micron Technology, Inc.
0 cites
US123537702025
Adaptive Block Mapping
Micron Technology, Inc.
0 cites
US123331812025
Source Address Memory Managment
Micron Techology, Inc.
0 cites
US123151172025
Illumination Field Non-uniformity Detection System, Detection Method, Correction Method, and Device
THE INSTITUTE OF OPTICS AND ELECTRONICS, THE CHINESE ACADEMY OF SCIENCES
0 cites
US123064242025
Metasurface-based Imaging System, Design Method, and Detector
THE INSTITUTE OF OPTICS AND ELECTRONICS, THE CHINESE ACADEMY OF SCIENCES
0 cites
US122725302025
Ultra-large Area Scanning Reactive Ion Etching Machine and Etching Method Thereof
The Institute Of Optics And Electronics, The Chinese Academy Of Sciences
0 cites
US122287102025
Ultra-wide Angle Broadband Polarization Imaging System Based on Metasurface, and Detection Apparatus
THE INSTITUTE OF OPTICS AND ELECTRONICS, THE CHINESE ACADEMY OF SCIENCES
0 cites
US122290002025
Managing Error-handling Flows in Memory Devices
Micron Technology, Inc.
0 cites
US122104482025
Virtual Indexing in a Memory Device
Micron Technology, Inc.
0 cites
US121977432025
Parity Protection in Non-volatile Memory
Micron Technology, Inc.
0 cites
US121817942024
Photolithography Method
THE INSTITUTE OF OPTICS AND ELECTRONICS, THE CHINESE ACADEMY OF SCIENCES
0 cites
US121743222024
F-P Sensor Probe, Absolute Distance Measurement Device, and Absolute Distance Measurement Method
THE INSTITUTE OF OPTICS AND ELECTRONICS, THE CHINESE ACADEMY OF SCIENCES
0 cites
US121117242024
Redundant Array Management Techniques
Micron Technology, Inc.
0 cites
US121001882024
Template Mark Detection Method and Template Position Correction Method Based on Single Camera
THE INSTITUTE OF OPTICS AND ELECTRONICS, THE CHINESE ACADEMY OF SCIENCES
0 cites
US120929602024
Mask Topology Optimization Method and System for Surface Plasmon Near-field Photolithography
THE INSTITUTE OF OPTICS AND ELECTRONICS, THE CHINESE ACADEMY OF SCIENCES
0 cites
US120857412024
Method for Preparing Super-resolution Lens Based on Metal-dielectric Strip Array, and Using Method of Super-resolution Lens
THE INSTITUTE OF OPTICS AND ELECTRONICS, THE CHINESE ACADEMY OF SCIENCES
0 cites
US120858462024
Method for Inverse Optical Proximity Correction of Super-resolution Lithography Based on Level Set Algorithm
THE INSTITUTE OF OPTICS AND ELECTRONICS, THE CHINESE ACADEMY OF SCIENCES
0 cites
US120789372024
Near-field Lithography Immersion System, Immersion Unit and Interface Module Thereof
The Institute Of Optics And Electronics, The Chinese Academy Of Sciences
0 cites
US120731072024
Memory Sub-system for Monitoring Mixed Mode Blocks
Micron Technology, Inc.
0 cites
US120571852024
Voltage Calibration Scans to Reduce Memory Device Overhead
Micron Technology, Inc.
0 cites
US120272132024
Determining Offsets for Memory Read Operations
Micron Technology, Inc.
0 cites
US119953262024
Selective Partitioning of Sets of Pages Programmed to Memory Device
Micron Technology, Inc.
0 cites
US119894332024
Dynamic Superblock Construction
Micron Technology, Inc.
0 cites
US119666162024
Voltage Bin Calibration Based on a Voltage Distribution Reference Voltage
Micron Technology, Inc.
0 cites
US119342682024
Memory Sub-system Using Partial Superblocks
Micron Technology, Inc.
0 cites
US119283562024
Source Address Memory Managment
Micron Technology, Inc.
0 cites
US119220692024
Adaptive Block Mapping
Micron Technology, Inc.
0 cites
US119144902024
Reactive Read Based on Metrics to Screen Defect Prone Memory Blocks
Micron Technology, Inc.
0 cites
US119070662024
Managing Storage of Multiple Plane Parity Data in a Memory Sub-system
Micron Technology, Inc.
0 cites
US118995742024
L2P Translation Techniques in Limited RAM Systems to Increase Random Write Performance Using Multiple L2P Caches
Micron Technology, Inc.
0 cites
US118863362024
Managing Workload of Programming Sets of Pages to Memory Device
Micron Technology, Inc.
0 cites
US118680552024
Multifunctional Lithography Device
The Institute Of Optics And Electronics, The Chinese Academy Of Sciences
0 cites
US118373072023
Managing Error-handling Flows in Memory Devices
Micron Technology, Inc.
0 cites
US118296232023
Using Incomplete Super Blocks for Increased Write Performance
Micron Technology, Inc.
0 cites
US118296502023
Memory Sub-system Data Migration
Micron Technology, Inc.
0 cites
US118227962023
Media Management on Power-up
Micron Technology, Inc.
0 cites
US118237482023
Voltage Bin Calibration Based on a Temporary Voltage Shift Offset
Micron Technology, Inc.
0 cites
US117839012023
Multi-tier Threshold Voltage Offset Bin Calibration
Micron Technology, Inc.
0 cites
US117751812023
Read Error Recovery
Micron Technology, Inc.
0 cites
US117766552023
Memory Device Virtual Blocks Using Half Good Blocks
Micron Technology, Inc.
0 cites
US117543522023
Visible Light-transparent and Radiative-cooling Multilayer Film
The Institute Of Optics And Electronics, The Chinese Academy Of Sciences
0 cites
US117409572023
Prioritization of Error Control Operations at a Memory Sub-system
Micron Technology, Inc.
0 cites
US117338922023
Partial Superblock Memory Management
Micron Technology, Inc.
0 cites
US117249622023
Method for Etching Curved Substrate
The Institute Of Optics And Electronics, The Chinese Academy Of Sciences
0 cites
US117268672023
Multi-page Parity Protection with Power Loss Handling
Micron Technology, Inc.
0 cites
US117280062023
Grown Bad Block Management in a Memory Sub-system
Micron Technology, Inc.
0 cites
US117143582023
Intelligent Correction Device Control System for Super-resolution Lithography Precision Mask
The Institute Of Optics And Electronics, The Chinese Academy Of Sciences
0 cites
US117097272023
Managing Error-handling Flows in Memory Devices
Micron Technology, Inc.
0 cites
US117040282023
Asynchronous Power Loss Impacted Data Structure
Micron Technology, Inc.
0 cites
US116933202023
Secondary Imaging Optical Lithography Method and Apparatus
The Institute Of Optics And Electronics, The Chinese Academy Of Sciences
0 cites
US116935862023
Over Provisioning Component for Memory Management
Micron Technology, Inc.
0 cites
US116937002023
Dynamic Size of Static SLC Cache
Micron Technology, Inc.
0 cites
US116947602023
Uncorrectable ECC
Micron Technology, Inc.
0 cites
US116752732023
Method of Fabricating Micro-nano Structure
The Institute Of Optics And Electronics, The Chinese Academy Of Sciences
0 cites
US116754112023
Dynamic P2L Asynchronous Power Loss Mitigation
Micron Technology, Inc.
0 cites
US116703422023
Recovery of Memory from Asynchronous Power Loss
Micron Technology, Inc.
0 cites
US116360442023
Logical-to-physical Mapping
Micron Technology, Inc.
0 cites
US116200742023
Voltage Bin Calibration Based on a Voltage Distribution Reference Voltage
Micron Technology, Inc.
0 cites
US116098462023
Managing Workload of Programming Sets of Pages to Memory Device
Micron Technology, Inc.
0 cites
US115994162023
Memory Sub-system Using Partial Superblocks
Micron Technology, Inc.
0 cites
US115926022023
Sub-wavelength Structural Material Having Patch Type Array and Compatibility of Low Detectability for Infrared, Laser, and Microwave
The Institute Of Optics And Electronics, Chinese Academy Of Sciences
0 cites
US115930322023
Memory Sub-system Data Migration
Micron Technology, Inc.
0 cites
US115876392023
Voltage Calibration Scans to Reduce Memory Device Overhead
Micron Technology, Inc.
0 cites
US115799962023
Memory Device with Configurable Performance and Defectivity Management
Micron Technology, Inc.
0 cites
US115676822023
Temperature Management for a Memory Device Using Memory Trim Sets
Micron Technology, Inc.
0 cites
US115562612023
Memory Stripe Coding Management
Micron Technology, Inc.
0 cites