Wook Rae Kim

3 Patents

• US126160032026

  Method for Fabricating a Semiconductor Device

  IUCF-HYU (INDUSTRY-UNIVERSITY COOPERATION

  0 cites
• US123455212025

  Optical Measurement Apparatus, Measuring Method Using the Same, and Method of Fabricating Semiconductor Device Using the Same

  SAMSUNG ELECTRONICS CO., Ltd.

  0 cites
• US122159742025

  Optical Measurement Apparatus, Measuring Method Using the Same, and Method for Fabricating Semiconductor Device Using the Same

  SAMSUNG ELECTRONICS CO., Ltd.

  0 cites