Patents/Inventors

Wontaeck Jung

Hwaseong-siKR11 patents

10 Patents

US125121692025
Nonvolatile Memory Device and Method of Detecting Defective Memory Cell Block of Nonvolatile Memory Device
SAMSUNG ELECTRONICS CO., Ltd.
0 cites
US124748742025
Memory Device, Memory Controller, and Memory System Including the Same
SAMSUNG ELECTRONICS CO., Ltd.
0 cites
US123408492025
Memory Device for Detecting Fail Cell and Operation Method Thereof
SAMSUNG ELECTRONICS CO., Ltd.
0 cites
US122303432025
Method of Detecting a Not-open String (N/O String), Converting Target Data, with a Value That Matches Inhibit Data, to Be Programmed to Target Memory Cells in the N/O String, and Programming the Memory Cells
SAMSUNG ELECTRONICS CO., Ltd.
0 cites
US122056562025
Memory Device and Method for Determining Start Point and End Point of Verification Operation of Target State During Programming
Samsung Electronics Co., Ltd.
0 cites
US118940922024
Memory System Including a Nonvolatile Memory Device, and an Erasing Method Thereof
SAMSUNG ELECTRONICS CO., Ltd.
0 cites
US118695822024
Non-volatile Memory Device and Method of Incrementally Programming the Same Using a Plurality of Program Loops
SAMSUNG ELECTRONICS CO., Ltd.
0 cites
US117639012023
Nonvolatile Memory Device and Method of Detecting Defective Memory Cell Block of Nonvolatile Memory Device
SAMSUNG ELECTRONICS CO., Ltd.
0 cites
US117267222023
Memory Device, Memory Controller, and Memory System Including the Same
SAMSUNG ELECTRONICS CO., Ltd.
0 cites
US115942932023
Memory Device with Conditional Skip of Verify Operation During Write and Operating Method Thereof
SAMSUNG ELECTRONICS CO., Ltd.
0 cites