Won Seok Cho

5 Patents

• US123527032025

  Electrode Quality Evaluation Method and Electrode Manufacturing Method

  LG ENERGY SOLUTION, Ltd.

  0 cites
• US122982292025

  Dry Quality Evaluation Device for Electrode and Dry Quality Evaluation Method for Electrode

  LG ENERGY SOLUTION, Ltd.

  0 cites
• US122707542025

  Dry Quality Evaluation Device for Electrode and Dry Quality Evaluation Method for Electrode

  LG ENERGY SOLUTION, Ltd.

  0 cites
• US119730352024

  Semiconductor Memory Device and Electronic System Including the Same

  SAMSUNG ELECTRONICS CO., Ltd.

  0 cites
• US116520562023

  Semiconductor Memory Device and Electronic System Including the Same

  SAMSUNG ELECTRONICS CO., Ltd.

  0 cites