Wolfgang Alexander Iff

5 Patents

• US124440392025

  Method and a System for Characterising Structures Through a Substrate

  UNITY SEMICONDUCTOR

  0 cites
• US121236982024

  Method and a System for Characterizing Structures Through a Substrate

  UNITY SEMICONDUCTOR

  0 cites
• US120799792024

  Method and a System for Characterising Structures Through a Substrate

  UNITY SEMICONDUCTOR

  0 cites
• US119597362024

  Method and a System for Characterising Structures Etched in a Substrate

  UNITY SEMICONDUCTOR

  0 cites
• US119597372024

  Method and a System for Combined Characterisation of Structures Etched in a Substrate

  UNITY SEMICONDUCTOR

  0 cites