William J. Egan

3 Patents

• US124752972025

  System and Method for Performing Process Model Calibration in a Virtual Semiconductor Device Fabrication Environment

  Coventor, Inc.

  0 cites
• US124234862025

  System and Method for Process Window Optimization in a Virtual Semiconductor Device Fabrication Environment

  Coventor, Inc.

  0 cites
• US118612892024

  System and Method for Performing Process Model Calibration in a Virtual Semiconductor Device Fabrication Environment

  Coventor, Inc.

  0 cites