Wilfried Vandervorst

2 Patents

• US125000622025

  Reconstruction Method for Atom Probe Tomography

  IMEC VZW

  0 cites
• US115499632023

  Method and Apparatus for Aligning a Probe for Scanning Probe Microscopy to the Tip of a Pointed Sample

  Katholieke Universiteit Leuven, KU Leuven R&D

  0 cites