6 Patents
- US122818932025Characterizing and Measuring in Small Boxes Using XPS with Multiple Measurements
NOVA MEASURING INSTRUMENTS Inc.
0 cites - US120663912024Method and System for Non-destructive Metrology of Thin Layers
NOVA MEASURING INSTRUMENTS, Inc.
0 cites - US119979322024Resistive Switching Memory Having Confined Filament Formation and Methods Thereof
CROSSBAR, Inc.
0 cites - US119885022024Characterizing and Measuring in Small Boxes Using XPS with Multiple Measurements
NOVA MEASURING INSTRUMENTS Inc.
0 cites - US119064512024Method and System for Non-destructive Metrology of Thin Layers
GLOBALFOUNDRIES U.S. Inc.
0 cites - US116686632023Method and System for Non-destructive Metrology of Thin Layers
NOVA MEASURING INSTRUMENTS, Inc.
0 cites