Patents/Inventors

Wei T Lee

San Jose, CAUS2 patents

3 Patents

US121584372024
XPS Metrology for Process Control in Selective Deposition
NOVA MEASURING INSTRUMENTS Inc.
0 cites
US117330352023
Feed-forward of Multi-layer and Multi-process Information Using XPS and XRF Technologies
NOVA MEASURING INSTRUMENTS Inc.
0 cites
US116809152023
XPS Metrology for Process Control in Selective Deposition
NOVA MEASURING INSTRUMENTS, Inc.
0 cites