Patents/Inventors

Wei-hsun Lin

Hsinchu CountyTW5 patents

6 Patents

US123136752025
Method and Device for Wafer-level Testing
TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY Ltd.
0 cites
US122708522025
Method and System for Wafer-level Testing
TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY Ltd.
0 cites
US120664842024
Method and Device for Wafer-level Testing
TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY Ltd.
0 cites
US120256552024
Method and System for Wafer-level Testing
TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY Ltd.
0 cites
US117546212023
Method and Device for Wafer-level Testing
TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY Ltd.
0 cites
US116301492023
Method and System for Wafer-level Testing
TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY Ltd.
0 cites