61 Patents
- US126205492026Dynamic Determination of a Sample Inspection Recipe of Charged Particle Beam Inspection
ASML Netherlands B.V.
0 cites - US126076422026Object Stage and Transfer Platform for Biological Sample Analyzer, and Biological Sample Analyzer
LEADWAY (HK) LIMITED
0 cites - US126091602026Resistance Compensation Device and Method for Storage Chip, and Storage Chip
ZHEJIANG HIKSTOR TECHNOLOGY CO., Ltd.
0 cites - US126088142026Systems and Methods for Brain Identifier Localization
WUHAN UNITED IMAGING SURGICAL CO., Ltd.
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- US125318032026Method and Apparatus for Sending Multicast Packet and Method and Apparatus for Obtaining Forwarding Entry
Huawei Technologies Co., Ltd.
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- US124877962025Validating and Providing Proactively Generated Code Completion Suggestions for Code Development
Amazon Technologies, Inc.
0 cites - US123548332025Multiple Landing Energy Scanning Electron Microscopy Systems and Methods
ASML Netherlands B.V.
0 cites - US123390772025Heat Exchanger Tube Block, Exhaust Heat Recovery Boiler, and Method of Constructing Exhaust Heat Recovery Boiler
KAWASAKI JUKOGYO KABUSHIKI KAISHA
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- US122603502025Method for Constructing Target Prediction Model in Multicenter Small Sample Scenario and Prediction Method
JIANGNAN UNIVERSITY
0 cites - US122605472025Machine Vision-based Automatic Identification and Rating Method and System for Low-magnification Acid Etching Defect
DAYE SPECIAL STEEL Co. , Ltd.
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- US121959962025Intelligent Anti-seismic Device for Shallow Foundation Ancient Buildings, and Construction Method Therefor
WUYI UNIVERSITY
0 cites - US121911122025System and Method for Defect Inspection Using Voltage Contrast in a Charged Particle System
ASML Netherlands B.V.
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- US121308602024Visual Feature Database Construction Method, Visual Positioning Method and Apparatus, and Storage Medium
HUAWEI TECHNOLOGIES CO., Ltd.
0 cites - US121307352024Data Writing Method and Apparatus for Flash Memory-based System
Huawei Technologies Co., Ltd.
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- US120805132024Cross-talk Cancellation in Multiple Charged-particle Beam Inspection
ASML Netherlands B.V.
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- US118547632023Backscattered Electron Detector, Apparatus of Charged-particle Beam Such as Electron Microscope Comprising the Same, and Method Thereof
BORRIES PTE. Ltd.
0 cites - US118547622023MEMS Sample Holder, Packaged Product Thereof, and Apparatus of Charged-particle Beam Such as Electron Microscope Using the Same
BORRIES PTE. Ltd.
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- US118294742023Text Classification Backdoor Attack Prediction Method, System, and Device
JIANGNAN UNIVERSITY
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- US117920032023Distributed Storage System and Method of Reusing Symmetric Keys for Encrypted Message Transmissions
VMWARE, Inc.
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- US117233602023Application of Methylmalonic Acid in the Preparation of Nematode Insecticides
Hubei Biopesticide Engineering Research Center
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- US116943122023Image Enhancement for Multi-layered Structure in Charged-particle Beam Inspection
ASML Netherlands B.V.
0 cites - 0 cites
- US116641862023Apparatus of Electron Beam Comprising Pinnacle Limiting Plate and Method of Reducing Electron-electron Interaction
BORRIES PTE. Ltd.
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- USD09839882023Sex Toy0 cites
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