15 Patents
- US126187232026Electronic Device, Parameter Calibration Method, and Non-transitory Computer Readable Storage Medium
HTC Corporation
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- US124023902025Method of Manufacturing Silicon Carbide Semiconductor Power Device
LEAP Semiconductor Corp.
0 cites - US123940942025Extrinsic Calibration Parameter Generating Device, Method, and Non-transitory Computer Readable Storage Medium Thereof
HTC Corporation
0 cites - US123763312025Semiconductor Power Device and Method of Manufacturing the Same
LEAP Semiconductor Corp.
0 cites - 0 cites
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- US121660822024Silicon Carbide Semiconductor Power Transistor and Method of Manufacturing the Same
LEAP Semiconductor Corp.
0 cites - 0 cites
- US121498022024Real-world View Display Method, Video Pass-through System and Non-transitory Computer Readable Storage Medium
HTC Corporation
0 cites - 0 cites
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- US119905532024Merged Pin Schottky (MPS) Diode and Method of Manufacturing the Same
LEAP Semiconductor Corp.
0 cites - US119555672024Wide-band Gap Semiconductor Device and Method of Manufacturing the Same
LEAP Semiconductor Corp.
0 cites - US116566042023Cutting Speed Planning System and Method and Non-transitory Storage Medium
ADLINK TECHNOLOGY Inc.
0 cites