Wei-de Ho

7 Patents

• US125819162026

  Etch Monitoring and Performing

  TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY, Ltd.

  0 cites
• US123745882025

  Method for Evaluating Non-uniform Stress

  Taiwan Semiconductor Manufacturing Co., Ltd.

  0 cites
• US123241642025

  Alignment Mark for MRAM Device and Method

  TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY, Ltd.

  0 cites
• US121192712024

  Backside Gate Contact, Backside Gate Etch Stop Layer, and Methods of Forming Same

  TAIWAN SEMICONDUCTOR MANUFACTURING CO., Ltd.

  0 cites
• US121208862024

  Memory Device and Manufacturing Method Thereof

  TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY, Ltd.

  0 cites
• US118044102023

  Thin-film Non-uniform Stress Evaluation

  Taiwan Semiconductor Manufacturing Co., Ltd.

  0 cites
• US117495702023

  Etch Monitoring and Performing

  TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY, Ltd.

  0 cites