Wei-da Kang

3 Patents

• US125387462026

  Apparatus and Methods for Determining Wafer Characters

  Taiwan Semiconductor Manufacturing Company, Ltd.

  0 cites
• US121257302024

  Apparatus and Methods for Determining Wafer Characters

  Taiwan Semiconductor Manufacturing Co., Ltd.

  0 cites
• US120663712024

  Method and Apparatus for Real-time Tool Defect Detection

  TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY Ltd.

  0 cites