Wei Chean Tan

6 Patents

• US123680172025

  Charged Particle Beam Apparatus and Focus Adjusting Method Therefor

  Hitachi High-tech Corporation

  0 cites
• US123548302025

  Sample Image Display System and Charged Particle Beam Apparatus

  Hitachi High-tech Corporation

  0 cites
• US121691822024

  Charged Particle Beam Apparatus

  Hitachi High-tech Corporation

  0 cites
• US120515632024

  Charged Particle Beam Device

  Hitachi High-tech Corporation

  0 cites
• US120464462024

  Charged Particle Beam Device

  Hitachi High-tech Corporation

  0 cites
• US117472922023

  Charged Particle Beam Apparatus

  Hitachi High-tech Corporation

  0 cites