3 Patents
- US124943432025Multiple Particle Beam Microscope and Associated Method with Fast Autofocus Around an Adjustable Working Distance
Carl Zeiss Multisem GmbH
0 cites - US124227432025Method for Measuring a Reflectivity of an Object for Measurement Light and Metrology System for Carrying Out the Method
Carl Zeiss SMT GmbH
0 cites