Patents/Inventors

Vladislav Kaplan

RaananaIL9 patents

4 Patents

US126187882026
System and Method for Denoising a Region of Interest of a Pattern
ETROLOGY, LLC
0 cites
US125796282026
Overlay Measurement Between Layers of a Semiconductor Specimen Based on Center of Symmetry (COS) Localization
Applied Materials Israel Ltd.
0 cites
US124373722025
System and Method for Denoising a Region of Interest of a Pattern
ETROLOGY, LLC
0 cites
US124379632025
Deep Structure Signal Detection and Enhancement by Separation to Upper (topography) and Lower (bottom) Areas for Robust Blind Denoising Self Supervision (BDSS)
ETROLOGY, LLC
0 cites