4 Patents
- US119356072024Circuit and Method to Detect Word-line Leakage and Process Defects in Non-volatile Memory Array
Stmicroelectronics International N.V.
0 cites - US117986032023Circuit for Generating and Trimming Phases for Memory Cell Read Operations
Stmicroelectronics International N.V.
0 cites - 0 cites
- US116158232023Circuit for Generating and Trimming Phases for Memory Cell Read Operations
STMICROELECTRONICS INTERNATIONAL N.V.
0 cites