Patents/Inventors

Vivek Kumar Jain

Fremont, CAUS2 patents

3 Patents

US122422012025
Determining Hot Spot Ranking Based on Wafer Measurement
ASML NETHERLANDS B.V.
0 cites
US120929652024
Process Variability Aware Adaptive Inspection and Metrology
ASML NETHERLANDS B.V.
0 cites
US116690202023
Method and Apparatus for Pattern Fidelity Control
ASML NETHERLANDS B.V.
0 cites