Patents/Inventors

Viktor Koldiaev

Morgan Hill, CAUS2 patents

3 Patents

US122419242025
Wafer Metrology Technologies
Femtometrix, Inc.
0 cites
US119886112024
Systems for Parsing Material Properties from Within SHG Signals
Femtometrix, Inc.
0 cites
US118219112023
Pump and Probe Type Second Harmonic Generation Metrology
Femtometrix, Inc.
0 cites