Patents/Inventors

Venkata Narayanan Srinivasan

Greater NoidaIN14 patents

15 Patents

US123992182025
Pors Testing in Multiple Power Domain Devices
Stmicroelectronics International N.V.
0 cites
US123666052025
Area, Cost, and Time-effective Scan Coverage Improvement
Stmicroelectronics International N.V.
0 cites
US123601612025
Scan Circuit and Method
Stmicroelectronics International N.V.
0 cites
US123457642025
Test Pattern Generation Using Multiple Scan Enables
STMICROELECTRONICS INTERNATIONAL N.V.
0 cites
US122724162025
ATPG Testing Method for Latch Based Memories, for Area Reduction
Stmicroelectronics International N.V.
0 cites
US122039822025
System and Method for Parallel Testing of Electronic Device
Stmicroelectronics International N.V.
0 cites
US121469112024
TVF Transition Coverage with Self-test and Production-test Time Reduction
Stmicroelectronics International N.V.
0 cites
US120207602024
ATPG Testing Method for Latch Based Memories, for Area Reduction
Stmicroelectronics International N.V.
0 cites
US119830252024
Reset and Safe State Logic Generation in Dual Power Flow Devices
STMICROELECTRONICS INTERNATIONAL N.V.
0 cites
US118359912023
Self-test Controller, and Associated Method
Stmicroelectronics International N.V.
0 cites
US117261402023
Scan Circuit and Method
Stmicroelectronics International N.V.
0 cites
US117141312023
Circuit and Method for Scan Testing
Stmicroelectronics International N.V.
0 cites
US116809822023
Automatic Test Pattern Generation Circuitry in Multi Power Domain System on a Chip
Stmicroelectronics International N.V.
0 cites
US115573642023
ATPG Testing Method for Latch Based Memories, for Area Reduction
Stmicroelectronics International N.V.
0 cites
US115503482023
Methods and Devices for Bypassing a Voltage Regulator
Stmicroelectronics International N.V.
0 cites