Vasco Tomas Tenner

8 Patents

• US125664062026

  Dark Field Digital Holographic Microscope and Associated Metrology Method

  ASML NETHERLANDS B.V.

  0 cites
• US124055352025

  Method for Filtering an Image and Associated Metrology Apparatus

  ASML Netherlands B.V.

  0 cites
• US123994342025

  Method of Determining a Characteristic of a Structure, and Metrology Apparatus

  ASML Netherlands B.V.

  0 cites
• US123668112025

  Metrology System and Method for Determining a Characteristic of One or More Structures on a Substrate

  ASML Netherlands B.V.

  0 cites
• US120667642024

  Metrology Apparatus and Method for Determining a Characteristic of One or More Structures on a Substrate

  ASML Netherlands B.V.

  0 cites
• US120077002024

  Metrology System and Method for Determining a Characteristic of One or More Structures on a Substrate

  ASML Netherlands B.V.

  0 cites
• US117094362023

  Metrology Apparatus and Method for Determining a Characteristic of One or More Structures on a Substrate

  ASML Netherlands B.V.

  0 cites
• US116500472023

  Metrology Apparatus and Method for Determining a Characteristic of One or More Structures on a Substrate

  ASML Netherlands B.V.

  0 cites