Patents/Inventors

Vamsi Pavan Rayaprolu

Santa Clara, CAUS98 patents

94 Patents

US126193612026
Scan Fragmentation in Memory Devices
Micron Technology, Inc.
0 cites
US125301232026
Adaptive Optimization of Error-handling Flows in Memory Devices
Micron Technology, Inc.
0 cites
US124988772025
Mitigating Slow Read Disturb in a Memory Sub-system
Micron Technology, Inc.
0 cites
US124511972025
Adaptive Integrity Scan Rates in a Memory Sub-system Based on Block Health Metrics
Micron Technology, Inc.
0 cites
US124312052025
Adaptive Calibration for Threshold Voltage Offset Bins
Micron Technology, Inc.
0 cites
US124300522025
Data Age and Validity-based Memory Management
Micron Technology, Inc.
0 cites
US123731092025
Validating Read Level Voltage in Memory Devices
Micron Technology, Inc.
0 cites
US123537712025
Charge Loss Mitigation Throughout Memory Device Lifecycle by Proactive Window Shift
Micron Technolgy, Inc.
0 cites
US123537532025
Diagonal Page Mapping in Memory Systems
Micron Technology, Inc.
0 cites
US123400952025
Management of Error-handling Flows in Memory Devices Using Probability Data Structure
Micron Technology, Inc.
0 cites
US123341662025
Data Integrity Checks Based on Voltage Distribution Metrics
Micron Technology, Inc.
0 cites
US123327422025
Memory Compaction Management in Memory Devices
Micron Technology, Inc.
0 cites
US123071112025
Block Family-based Error Avoidance for Memory Devices
Micron Technology, Inc.
0 cites
US122879822025
Host Data Storage Scan Data Retention Rating
Micron Technology, Inc.
0 cites
US122664202025
Temperature-compensated Time Estimate for a Block to Reach a Uniform Charge Loss State
Micron Technology, Inc.
0 cites
US122303152025
Model for Predicting Memory System Performance
Micron Technology, Inc.
0 cites
US122231902025
Measurement of Representative Charge Loss in a Block to Determine Charge Loss State
Micron Technology, Inc.
0 cites
US121820132024
Memory Sub-system Write Sequence Track
Micron Technology, Inc.
0 cites
US121648042024
Memory Sub-system Media Management Groups
Micron Technology, Inc.
0 cites
US121647832024
Cross-temperature Compensation Based on Media Endurance in Memory Devices
Micron Technology, Inc.
0 cites
US121484842024
Memory Sub-system Scan
Micron Technology, Inc.
0 cites
US121317952024
Adaptive Temperature Compensation for a Memory Device
Micron Technology, Inc.
0 cites
US121317902024
Media Management Operations Based on Health Characteristics of Memory Cells
Micron Technology, Inc.
0 cites
US121190682024
Program Continuation Strategies After Memory Device Power Loss
Micron Technology, Inc.
0 cites
US120873692024
Power State Aware Scan Frequency
Micron Technology, Inc.
0 cites
US120727622024
Error-handling Management During Copyback Operations in Memory Devices
Micron Technology, Inc.
0 cites
US120507772024
Adaptive Scanning of Memory Devices with Supervised Learning
Micron Technology, Inc.
0 cites
US120400252024
Two-sided Page Scans with Calibration Feedback
Micron Technology, Inc.
0 cites
US120328332024
Management of Error-handling Flows in Memory Devices Using Probability Data Structure
MICRON TECHNOLOGY, Inc.
0 cites
US120198742024
Adaptive Optimization of Error-handling Flows in Memory Devices
Micron Technology, Inc.
0 cites
US120090422024
Executing a Refresh Operation in a Memory Sub-system
Micron Technology, Inc.
0 cites
US120078382024
Accessing Data Using Error Correction Operation(s) to Reduce Latency at a Memory Sub-system
Micron Technology, Inc.
0 cites
US119953202024
Scan Fragmentation in Memory Devices
Micron Technology, Inc.
0 cites
US119949362024
Automated Optimization of Error-handling Flows in Memory Devices
MICRON TECHNOLOGY, Inc.
0 cites
US119841742024
Accelerating Configuration Updates for Memory Devices
Micron Technology, Inc.
0 cites
US119785142024
Erase Cycle Healing Using a High Voltage Pulse
Micron Technology, Inc.
0 cites
US119777742024
Charge Loss Mitigation Throughout Memory Device Lifecycle by Proactive Window Shift
Micron Technology, Inc.
0 cites
US119721302024
Media Management Operations Based on a Ratio of Valid Data
Micron Technology, Inc.
0 cites
US119412852024
Mitigating Slow Read Disturb in a Memory Sub-system
Micron Technology, Inc.
0 cites
US119421602024
Performing a Program Operation Based on a High Voltage Pulse to Securely Erase Data
Micron Technology, Inc.
0 cites
US119412772024
Combination Scan Management for Block Families of a Memory Device
Micron Technology, Inc.
0 cites
US119346892024
Word Line Group Read Counters
Micron Technology, Inc.
0 cites
US119342662024
Memory Compaction Management in Memory Devices
Micron Technology, Inc.
0 cites
US119283532024
Multi-page Parity Data Storage in a Memory Device
Micron Technology, Inc.
0 cites
US119230302024
Optimized Storage Charge Loss Management
Micron Technology, Inc.
0 cites
US119230212024
Selection of Read Offset Values in a Memory Sub-system Based on Temperature and Time to Program Levels
Micron Technology, Inc.
0 cites
US119148902024
Trim Value Loading Management in a Memory Sub-system
Micron Technology, Inc.
0 cites
US119144902024
Reactive Read Based on Metrics to Screen Defect Prone Memory Blocks
Micron Technology, Inc.
0 cites
US119075362024
Data Dispersion-based Memory Management
Micron Technology, Inc.
0 cites
US118876512024
Temperature Informed Memory Refresh
Micron Technology, Inc.
0 cites
US118867262024
Block Family-based Error Avoidance for Memory Devices
Micron Technology, Inc.
0 cites
US118758682024
Quick Reliability Scan for Memory Device
MICRON TECHNOLOGY, Inc.
0 cites
US118686392024
Providing Recovered Data to a New Memory Cell at a Memory Sub-system Based on an Unsuccessful Error Correction Operation
MICRON TECHNOLOGY, Inc.
0 cites
US118682022024
Granular Error Reporting on Multi-pass Programming of Non-volatile Memory
Micron Technology, Inc.
0 cites
US118546492023
Temperature-compensated Time Estimate for a Block to Reach a Uniform Charge Loss State
Micron Technology, Inc.
0 cites
US118470512023
Memory Sub-system Logical Block Address Remapping
Micron Technology, Inc.
0 cites
US118417942023
Memory Sub-system Write Sequence Track
Micron Technology, Inc.
0 cites
US118372912023
Voltage Offset Bin Selection by Die Group for Memory Devices
Micron Technology, Inc.
0 cites
US118363922023
Relocating Data to Low Latency Memory
Micron Technology, Inc.
0 cites
US118106312023
Data Integrity Checks Based on Voltage Distribution Metrics
Micron Technology, Inc.
0 cites
US118106272023
Selective Read Disturb Sampling
Micron Technology, Inc.
0 cites
US117972162023
Read Calibration Based on Ranges of Program/erase Cycles
Micron Technology, Inc.
0 cites
US117972052023
Measurement of Representative Charge Loss in a Block to Determine Charge Loss State
Micron Technology, Inc.
0 cites
US117910002023
Valid Translation Unit Count-based Memory Management
Micron Technology, Inc.
0 cites
US117826272023
Read Count Scaling Factor for Data Integrity Scan
Micron Technology, Inc.
0 cites
US117627672023
Storing Highly Read Data at Low Impact Read Disturb Pages of a Memory Device
Micron Technology, Inc.
0 cites
US117566362023
Determining Threshold Values for Voltage Distribution Metrics
Micron Technology, Inc.
0 cites
US117409572023
Prioritization of Error Control Operations at a Memory Sub-system
Micron Technology, Inc.
0 cites
US117338962023
Reliability Scan Assisted Voltage Bin Selection
Micron Technology, Inc.
0 cites
US117266892023
Time-based Combining for Block Families of a Memory Device
Micron Technology, Inc.
0 cites
US117268672023
Multi-page Parity Protection with Power Loss Handling
Micron Technology, Inc.
0 cites
US117279942023
Performing Threshold Voltage Offset Bin Selection by Package for Memory Devices
Micron Technology, Inc.
0 cites
US117202862023
Extended Cross-temperature Handling in a Memory Sub-system
Micron Technology, Inc.
0 cites
US117214092023
Smart Sampling for Block Family Scan
Micron Technology, Inc.
0 cites
US117155412023
Workload Adaptive Scans for Memory Sub-systems
Micron Technology, Inc.
0 cites
US117155312023
Open Block Management Using Storage Charge Loss Margin Checking
Micron Technology, Inc.
0 cites
US117105272023
Mitigating a Voltage Condition of a Memory Cell in a Memory Sub-system
Micron Technology, Inc.
0 cites
US117041792023
Regression-based Calibration and Scanning of Data Units
Micron Technology, Inc.
0 cites
US116988322023
Selective Sampling of a Data Unit During a Program Erase Cycle Based on Error Rate Change Patterns
Micron Technology, Inc.
0 cites
US116884792023
Read Window Based on Program/erase Cycles
Micron Technology, Inc.
0 cites
US116874522023
Dynamic Program-verify Voltage Adjustment for Intra-block Storage Charge Loss Uniformity
Micron Technology, Inc.
0 cites
US116824462023
Selective Wordline Scans Based on a Data State Metric
Micron Technology, Inc.
0 cites
US116627862023
Temperature Compensation in a Memory System
Micron Technology, Inc.
0 cites
US116569312023
Selective Sampling of a Data Unit Based on Program/erase Execution Time
Micron Technology, Inc.
0 cites
US116369082023
Global-local Read Calibration
Micron Technology, Inc.
0 cites
US116251772023
Combination Scan Management for Block Families of a Memory Device
Micron Technology, Inc.
0 cites
US116158582023
Media Management Operations Based on Health Characteristics of Memory Cells
Micron Technology, Inc.
0 cites
US116046012023
Trim Value Loading Management in a Memory Sub-system
Micron Technology, Inc.
0 cites
US115992862023
Data Age and Validity-based Memory Management
Micron Technology, Inc.
0 cites
US115676652023
Data Dispersion-based Memory Management
Micron Technology, Inc.
0 cites
US115617222023
Multi-page Parity Data Storage in a Memory Device
Micron Technology, Inc.
0 cites
US115573572023
Selection of Read Offset Values in a Memory Sub-system
Micron Technology, Inc.
0 cites
US115452322023
Quick Reliability Scan for Memory Device
MICRON TECHNOLOGY, Inc.
0 cites
US115440082023
Temperature Correction in Memory Sub-systems
Micron Technology, Inc.
0 cites