Vadim Yourievich Timoshkov

3 Patents

• US123862682025

  Method for Calibrating Simulation Process Based on Defect-based Process Window

  ASML NETHERLANDS B.V.

  0 cites
• US123151752025

  Method in the Manufacturing Process of a Device, a Non-transitory Computer-readable Medium and a System Configured to Perform the Method

  ASML NETHERLANDS B.V.

  0 cites
• US120449802024

  Method of Manufacturing Devices

  ASML NETHERLANDS B.V.

  0 cites